IEEE 33rd INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA 2026)
13th - 16 th July 2026 | Marina Bay Sands Singapore
We welcome IPFA attendees back to Singapore!
IPFA is a cornerstone conference for Semiconductor Failure Analysis and Reliability Assessment, attracting over 550 participants, including academics, industry experts, and vendors/exhibitors over a complete 4-day technical program.
For general inquiries, please contact IPFA secretariat Jasmine Leong jasmine@jjayes.com.
Call For Papers - (Open NOW !!)
The IPFA 2026 Call for Papers is now open, inviting submissions on topics in failure analysis (FA) and reliability (REL). We seek innovative paper that pushes the boundaries of technology and methodology. Topics of interest include:
Electrical fault isolation techniques
Physical and package-level failure analysis
Transistor reliability
ESD and latch-up mechanisms
Integration of AI for failure detection and reliability assessments
Many more…
Join us in shaping the future of failure analysis and reliability by sharing your expertise and insights. Submit your paper today and be part of this premier event for advancing reliability and failure analysis.